Avoiding Combinatorial Explosion in Automatic Test Generation: Reasoning about Measurements is the Key

The main thesis of this paper is that reasoning about measurements can be used as a basic mechanism for generating test plans for analogical circuits. Motivated by an application scenario, reasoning about measurements incorporates domain knowledge about testing conditions, local behavior of circuit components (fault modes covered by measurements) and the topological structure of the circuit to be tested. With the test generation architecture introduced in this paper, a combinatorial explosion which is problematic in model-based test generation approaches can be avoided.